Category: IEC
IEC
Industrial communication networks – Fieldbus specifications – Part 5-8: Application layer service definition – Type 8 elements
standard by International Electrotechnical Commission, 12/14/2007
Radio-frequency connectors – Part 24: Sectional specification – Radio frequency coaxial connectors with screw coupling, typically for use in 75 Ω cable networks (type F)
standard by International Electrotechnical Commission, 07/19/2019
Industrial communication networks – Fieldbus specifications – Part 6-13: Application layer protocol specification – Type 13 elements
standard by International Electrotechnical Commission, 12/14/2007
Industrial communication networks – Fieldbus specifications – Part 3-25: Data-link layer service definition – Type X elements
standard by International Electrotechnical Commission, 04/10/2019
Industrial communication networks – Fieldbus specifications – Part 4-11: Data-link layer protocol specification – Type 11 elements
standard by International Electrotechnical Commission, 08/05/2010
Nuclear instrumentation – Amplifiers and preamplifiers used with detectors of ionizing radiation – Test procedures
standard by International Electrotechnical Commission, 09/15/1992
Radionuclide imaging devices – Characteristics and test conditions – Part 2: Single photon emission computed tomographs CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 02/07/2005
Electrical equipment for measurement, control and laboratory use – EMC requirements – Part 3-2: Immunity requirements for safety-related systems and for equipment intended to perform safety-related functions (functional safety) – Industrial applications with specified electromagnetic environment
standard by International Electrotechnical Commission, 01/30/2008
Reliability stress screening – Part 2: Electronic components
standard by International Electrotechnical Commission, 11/27/1998
Test methods for electrical materials, interconnection structures and assemblies – Part 5: Test methods for printed board assemblies
standard by International Electrotechnical Commission, 08/29/2006