IEC 60747-18-1 Ed. 1.0 en:2019

Posted on: 09/12/202012/21/2019
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IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

Product Details

Edition:: 1.0
Published:: 05/20/2019
Number of Pages:: 26
File Size:: 1 file , 2.3 MB

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